"Method and systems for optimizing frequency modulation atomic force microscopy"
Aleksander Labuda, Peter Grütter, Yoichi Miyahara, William Paul, Antoine Roy-Gobeil
U.S. Patent No. US 14/384,791 (2015).

"Optical beam positioning unit for atomic force microscope"
Aleksander Labuda, Jason Cleveland, Deron Walters, Roger Proksch
U.S. Patent No. US 13/999,614 (2014).

"Method and apparatus for measuring cantilever deflection in constrained spaces"
Dilson Rassier, Aleksander Labuda
U.S. Patent No. US 13/097,197 (2014).

"Method and system for optical microscopy"
Dilson Rassier, Albert Kalganov, Aleksander Labuda
U.S. Patent No. US 13/632,221 (2014).